Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-06-12
2007-06-12
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C324S526000, C324S648000, C324S725000, C324S076610, C710S306000, C710S315000
Reexamination Certificate
active
10904047
ABSTRACT:
A method and an apparatus for testing a bridge circuit. The method includes inputting a first test clock to a first conversion unit for triggering the first conversion unit to transfer a test data to a second conversion unit according to rising edges of the first test clock, inputting a second test clock to the second conversion unit for triggering the second conversion unit to output an output data according to falling edges of the second test clock, and controlling the first test clock and the second test clock so that the rising edges of the second test clock are not synchronized to the rising edges of the first test clock. A frequency of the first test clock is an even multiple of a frequency of the second test clock.
REFERENCES:
patent: 6247102 (2001-06-01), Chin et al.
patent: 6263389 (2001-07-01), LaBerge
patent: 6338143 (2002-01-01), Shimazaki
patent: 2005/0086019 (2005-04-01), Yeh et al.
patent: 347939 (1998-12-01), None
Lai Jiin
Wu Victor
Yeh Biyun
Desta Elias
Hoff Marc S.
Hsu Winston
VIA Technologies Inc.
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