Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-01-25
2005-01-25
Shah, Kamini (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S132000, C713S300000, C713S322000
Reexamination Certificate
active
06847911
ABSTRACT:
A method of throttling the frequency with which an integrated circuit is accessed includes sensing the temperature of the integrated circuit die and converting the sensed temperature to a digital signal. The digital signal is stored in a register of the integrated circuit. The digital signal is read, and the frequency with which the integrated circuit is accessed is adjusted dependent at least in part upon the temperature of the die as indicated by the digital signal.
REFERENCES:
patent: 5940785 (1999-08-01), Georgiou et al.
Edmonds Johnathan
Huckaby Jennifer Faye
Partsch Torsten
Cherry Stephen J.
FitzGerald Esq. Thomas R.
Infineon - Technologies AG
Roach, Esq. Laurence S.
Shah Kamini
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