Method and apparatus for temperature control of a semiconductor

Electric heating – Heating devices – With power supply and voltage or current regulation or...

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

219209, 219494, 438715, 324760, H05B 102

Patent

active

060910623

ABSTRACT:
A semiconductor device handler with a temperature controlled test area. Temperature control is provided in part through the use of temperature controlled air forced across the test area. For heating the test area, electrical resistance heaters are uniformly distributed through the test area and are controlled to provide the desired temperature. The handler has a close pitch between adjacent sockets such that is not possible to distribute refrigeration elements over the test area. Instead, a refrigeration element is placed on one side of the test area. To prevent formation of an undesirable temperature gradient, heat is injected at a specific location in the test area.

REFERENCES:
patent: 3979671 (1976-09-01), Meeker et al.
patent: 4370011 (1983-01-01), Suzuki et al.
patent: 4604572 (1986-08-01), Horiuchi et al.
patent: 4607220 (1986-08-01), Hollman
patent: 4734872 (1988-03-01), Eager et al.
patent: 4739257 (1988-04-01), Jenson et al.
patent: 4791364 (1988-12-01), Kufis et al.
patent: 4848090 (1989-07-01), Peters
patent: 4962355 (1990-10-01), Holderfield et al.
patent: 4982153 (1991-01-01), Collins et al.
patent: 5126656 (1992-06-01), Jones
patent: 5166607 (1992-11-01), Long
patent: 5172049 (1992-12-01), Kiyokawa et al.
patent: 5283854 (1994-02-01), Schiebelhuth
patent: 5360348 (1994-11-01), Johnson
patent: 5373893 (1994-12-01), Eisenmann et al.
patent: 5523678 (1996-06-01), Mitsui
patent: 5528159 (1996-06-01), Charlton et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for temperature control of a semiconductor does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for temperature control of a semiconductor , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for temperature control of a semiconductor will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2038962

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.