Method and apparatus for synthesizing a drive signal for active

Details Method and apparatus for synthesizing a drive signal for active Method and apparatus for synthesizing a drive signal for active

1982-10-28

1985-03-26

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

307263, 307268, 307443, 307465, 324 73R, 371 27, H03K 512, H03K 19092

Patent

active

045075760

ABSTRACT:
A special purpose pulse amplifier with programmable high and low levels for complex IC testing is disclosed. Its output has independently programmable positive and negative transition rates and is reverse terminated in 50 ohms. It also has the ability to be switched to a high resistance, low capacitance output state. This circuit is the interface between a complex, computer controlled system of timing and pattern generation hardware, and an integrated circuit to be tested. This device has reduced waveform aberrations, lower inhibited capacitance, low input to output delay for reducing timing error, programmable signal transition rates, and the amplitude range and transition rate control to accommodate all the important device technologies expected in high pin-count parts.

REFERENCES:
patent: 3832535 (1974-08-01), De Vito
patent: 3914623 (1975-10-01), Clancy
patent: 3982115 (1976-09-01), Traa
patent: 4241362 (1980-12-01), Van der Valk
patent: 4339669 (1982-07-01), Jarrett et al.
patent: 4399405 (1983-08-01), Welzhofer
patent: 4439858 (1984-03-01), Petersen
Prilik, "Dedicated Pin, Multiple Function Testing Circuit For LSI", IBM Tech. Disc. Bull., vol. 19, No. 3, Aug. 1976, pp. 987-988.
Millham et al., "Logical Assembly Testing System", IBM Tech. Disc. Bull., vol. 14, No. 11, Apr. 1972, pp. 3446-3449.

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