Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-04-19
2011-04-19
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S125000
Reexamination Certificate
active
07930121
ABSTRACT:
Traditionally, time stamp circuits have been used for precise digital time measurements. The resolution of these types of circuits, though, was generally limited by clock speed. Here, an apparatus is provided that performs time stamp operations and is not generally limited by clock speed. This apparatus generally uses an interpolator, counter, lathing circuits, and a synchronizer. Typically, the interpolator provides a residue signal to the synchronizer, and the synchronizer can determines whether to add the interpolation signal to a counter state based at least in part on a comparison of an event signal and the residue signal.
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Antti Nantyniemi, An integrated CMOS high precision time-to-digital converter based on stabilised three-stage delay line interpolation , 2004, Oulu, Finland ISBN 951-42-7460-1. ISBN 951-42-7461-X (PDF). URL http://herkules.oulu.fi/isbn951427461X/.
Brantley Steven Graham
Cavaliere Francesco
MacLean James Richard
Brady III Wade J.
Desta Elias
Feliciano Eliseo Ramos
Patti John J.
Telecky , Jr. Frederick J.
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