Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-07-17
2007-07-17
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C331S00100A, C324S076530, C714S738000
Reexamination Certificate
active
10766073
ABSTRACT:
The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.
REFERENCES:
patent: 4629999 (1986-12-01), Hatch et al.
patent: 6859028 (2005-02-01), Toner
patent: 7093177 (2006-08-01), West et al.
Bodrero Vanessa Marie
Chiari Alain Charles
Heaton Dale Alan
Lambert Craig James
Barlow John
Brady III Wade James
Le John
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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