Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2011-08-16
2011-08-16
Le, John H (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C324S076530, C702S117000, C714S738000
Reexamination Certificate
active
08000921
ABSTRACT:
The preferred embodiments of the present invention provide approaches for synchronizing signals in a testing system. In some embodiments, the timing signal associated with each device under test (DUT) is maintained at an integer multiple of the tester timing signal. Additionally, in other embodiments, the timing signal associated with various DUTs is used as a timing reference for other devices.
REFERENCES:
patent: 6859028 (2005-02-01), Toner
patent: 7093177 (2006-08-01), West et al.
Bodrero Vanessa M
Chiari Alain C
Heaton Dale A
Lambert Craig J
Brady III Wade J.
Le John H
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
Tung Yingsheng
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