Radiant energy – Ion generation – Field ionization type
Patent
1978-08-02
1979-07-24
Anderson, Bruce C.
Radiant energy
Ion generation
Field ionization type
324 96, H01J 2700
Patent
active
041624041
ABSTRACT:
A method and apparatus for monitoring particulates which are borne by a surrounding gaseous medium, such as found in smokestacks or the like, through interception of the particulates by a hot filament having a bias potential in the range of about 100 to 1000 volts whereupon each particulate decomposes into a burst of ions which is collected by a nearby electrode at ground potential, by counting those bursts which produce a predetermined total charge and, at the same time, measuring the DC electric current produced by the bursts and other ion exchange between the hot filament and the electrode. The filament operates at a temperature level wherein infrared and visible radiations are emitted, such radiations being monitored by a phototransistor which receives the radiations. The electrical signal from the phototransistor is employed in a feedback loop whereby the power to the filament is automatically either increased or decreased, and manually regulated within limits to maintain the detected radiation level and therefore the filament temperature at a prescribed value.
REFERENCES:
patent: 1859469 (1932-05-01), Richardson
patent: 3402358 (1968-09-01), Wharton
patent: 3433944 (1969-03-01), George
patent: 3973121 (1976-08-01), Fite et al.
Brackmann Richard T.
Fite Wade L.
Myers Richard L.
Albright Penrose Lucas
Anderson Bruce C.
Extranuclear Laboratories Inc.
Mason William B.
LandOfFree
Method and apparatus for surface ionization monitor for particul does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for surface ionization monitor for particul, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for surface ionization monitor for particul will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1288775