Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Patent
1998-11-20
2000-08-22
Pham, Hoa Q.
Optics: measuring and testing
Inspection of flaws or impurities
Surface condition
3562374, G01N 2100
Patent
active
061080780
ABSTRACT:
A foreign matter on the surface of an object of inspection is detected by throwing an inspecting light beam on the surface of the object of inspection and sensing a scattered light beam reflected from the surface of the object of inspection while the inspecting light beam is allowed to make a spiral scan. When the signal of the scattered light beam by the foreign matter exceeds a threshold signal at a point while the inspection light beam scans the object in the predetermined direction, the point is stored as a start point and, when, thereafter, the foreign-matter scattered signal falls below the threshold signal at a point, the point is stored as an end point, and, further, a point between the start point and the end point where the foreign-matter scattered signal was at its maximum level is stored as a peak. A threshold signal level is established between the effective range where a foreign matter or flaw is measured and the circumferential range beyond the effective range. While measurement is being made in the effective range, when the threshold signal level is exceeded at a point, the point is set as a start position and, when the threshold signal level is exceeded thereafter, the point is set as an and position. The manner of measurement between the start position and the end position is made different from the manner of measurement in the effective range and, further, the manner of measurement between the start position and the end position and the manner of measurement in the effective range are automatically charged over.
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Kabushiki Kaisha Topcon
Pham Hoa Q.
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