Method and apparatus for surface analysis

Details Method and apparatus for surface analysis Method and apparatus for surface analysis

1975-08-11

1976-08-03

Corbin, John K.

Optics: measuring and testing

Refraction testing

Prism engaging specimen

350 15, 356209, G01N 2140

Patent

active

039726193

ABSTRACT:
A method and apparatus are described for measuring anisotropy in the reflectivity within a region of a surface. The apparatus basically comprises a polarizing microscope which employs a rotating half-wave plate which rotates the polarization direction of the light incident upon the surface being examined and which also rotates the polarization direction of the light reflected from the surface being examined. The intensity of the reflected light passing through a polarizing filter is detected and related to the anisotropy.

REFERENCES:
patent: 2944463 (1960-07-01), Rantsch
patent: 3914057 (1975-10-01), Smith et al.

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