Method and apparatus for suppressing the effects of surface ligh

Optics: measuring and testing – Of light reflection – With diffusion

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250566, G01N 2122, G06K 714

Patent

active

042265410

ABSTRACT:
A method and apparatus for suppressing the effects of surface light scatter in an optical reflective scanning system, wherein the method includes the steps of directly illuminating a small area upon the surface to be scanned, detecting the intensity of the light reflected by that area to produce a first signal proportional thereto, detecting the intensity of the light reflected from a scatter illuminated second area at least partially surrounding the directly illuminated area to produce a second signal proportional thereto, subtracting at least a portion of the second signal from the first signal to develop a compensated signal which represents the reflectivity of the directly illuminated first area as compensated for the light scattered back to the first area from the second area, and either using the compensated signal directly as analog data or converting it to a digital output signal which has a first state when the compensated signal is above a predetermined threshold and which has a second state when the compensated signal is below the predetermined threshold. The apparatus includes a light source and focusing optics for directly illuminating a small area of a surface to be scanned, detector optics for collecting light reflected from the directly illuminating area and directing it upon a first detector, and for collecting light reflected from a scatter illuminated second area at least partially surrounding the first area and directing it upon a second detector, and processing electronics responsive to signals generated by the first and second detectors and operative to produce an analog or digital output signal as described above.

REFERENCES:
patent: 3883436 (1975-05-01), Fletcher
patent: 3890499 (1975-06-01), Lippel
patent: 3977792 (1976-08-01), Jumonji et al.
patent: 4152586 (1979-05-01), Elliott et al.

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