Measuring and testing – Vibration – By mechanical waves
Patent
1984-03-16
1985-08-20
Kreitman, Stephen A.
Measuring and testing
Vibration
By mechanical waves
364508, G01N 2904
Patent
active
045356297
ABSTRACT:
An acoustic emission monitoring system used for monitoring fatigue crack growth in metal or other materials such as occur, for example, in highway bridges during normal traffic loading. The transducers are placed on the plates to be tested to allow detection of acoustic emission from a particular site. By applying specific recognition methods to the acoustic emission AE, detection of flaws can be detected from a random noise background. The pattern recognition technique first subjects the received AE energy to an energy window test and if the energy is within the window, it is subjected to a rate test and if the energy exceeds predetermined rates, it is passed to a location test so as to locate the position of flaws.
REFERENCES:
patent: 3379972 (1968-04-01), Foster et al.
patent: 3455149 (1969-07-01), Foster et al.
patent: 3503251 (1970-03-01), Flagge
patent: 3782183 (1974-01-01), O'Connor et al.
patent: 3858439 (1975-01-01), Nakamura
patent: 3936822 (1976-02-01), Hirschberg
patent: 3985024 (1976-10-01), Horak
patent: 4009463 (1977-02-01), Vercellotti et al.
patent: 4010637 (1977-03-01), Harwell et al.
patent: 4036057 (1977-07-01), Morais
patent: 4086816 (1978-05-01), Jon et al.
patent: 4086817 (1978-05-01), Jon et al.
patent: 4207771 (1980-06-01), Carlos et al.
patent: 4413507 (1983-11-01), Drew et al.
Chamberlain Manufacturing Corporation
Kreitman Stephen A.
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