Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1997-01-02
2000-02-01
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
G01R 3126
Patent
active
060207515
ABSTRACT:
A method and apparatus for testing a circuit board is disclosed. An apparatus having at least one clock source for providing a circuit board with a clock signal at a dynamically selected frequency, a storage medium storing programming instructions to control the clock source(s) to provide the clock signal at the dynamically selected frequency including a frequency that exceeds the specified operating range of frequencies for the circuit board, and for implementing parametric testing of the circuit board, and an execution unit coupled to the clock source and to the storage medium for executing the programming instructions. The programming instructions for implementing the parametric testing of the circuit board include instructions for testing the circuit board while the circuit board is supplied with the clock signal at the frequency that exceeds the operating frequency of the circuit board, thereby stressing the circuit board. The programming instructions cause the one or more clock sources to gradually increase the dynamically selected clock signal frequency to the frequency that exceeds the operating frequency of the circuit board.
REFERENCES:
patent: 4430735 (1984-02-01), Catiller
patent: 5583875 (1996-12-01), Weiss
patent: 5796751 (1998-08-01), Kundu
Hall Jerald N.
Rampone Thomas A.
Ballato Josie
Intel Corporation
Kobert Russell M.
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