Measuring and testing – Fluid pressure gauge – With pressure and/or temperature compensation
Reexamination Certificate
2008-01-01
2008-01-01
Allen, Andre J. (Department: 2855)
Measuring and testing
Fluid pressure gauge
With pressure and/or temperature compensation
Reexamination Certificate
active
11012871
ABSTRACT:
A method and apparatus for measuring gas pressure by combining an ionization gauge with at least one other vacuum sensor. Nonvolatile memory coupled to the vacuum gauge contains calibration parameters unique to each individual sensor based on factory calibration. The nonvolatile memory may contain calibration parameters for a heat-sensitive vacuum sensor to compensate for the temperature gradients generated by the ionization gauge. The calibration parameters are a function of calibration data determined when the ionization gauge is both on and off. The nonvolatile memory may store a window of measurement data of the vacuum gauge that is updated at predetermined time intervals and in response to an event, such as an error event, to aid in investigating the cause of vacuum gauge malfunction or failure.
REFERENCES:
patent: 4237900 (1980-12-01), Schulman et al.
patent: 4284892 (1981-08-01), Hulot et al.
patent: 4481804 (1984-11-01), Eberhard et al.
patent: 4652752 (1987-03-01), Ino et al.
patent: 4691167 (1987-09-01), v.d. Vlekkert et al.
patent: 4755669 (1988-07-01), Grant et al.
patent: 4866640 (1989-09-01), Morrison, Jr. et al.
patent: 5088314 (1992-02-01), Takashi
patent: 5185709 (1993-02-01), Johnson et al.
patent: 5250906 (1993-10-01), Bills et al.
patent: 5296817 (1994-03-01), Bills et al.
patent: 5377128 (1994-12-01), McBean
patent: 5422573 (1995-06-01), Bills et al.
patent: 5557972 (1996-09-01), Jacobs et al.
patent: 5583297 (1996-12-01), Stocker et al.
patent: 5857777 (1999-01-01), Schuh
patent: 5918194 (1999-06-01), Banaska et al.
patent: 5940780 (1999-08-01), Azar et al.
patent: 6470295 (2002-10-01), Mirow et al.
patent: 6515482 (2003-02-01), Kawasaki
patent: 6658941 (2003-12-01), Bills et al.
patent: 198 60 500 (2000-07-01), None
Teledyne Hastings Instruments, Model IGE-3000 [online], Apr. 2005 [retrieved on Jun. 3, 2005] Retrieved from the Internet, URL<http://www.hastingsinst.com/dpfs/IGE-3000%20072903.pdf.
Teledyne Hastings Instruments, HPM-2002-OBE Vacuum Gauge Instruction Manual [online], Jun. 2004 [retrieved on Jun. 3, 2005]. Retrieved from the Internet <URL://www.hastings-inst.com/Manual/Vacuum/155—062004—HPM-2002-OBE.pdf>.
Teledyne Hastings Instruments, Model 2002: Dual Sensor Vacuum Gauge [online], Apr. 2005 [ retrieved Jun. 3, 2005] Retrieved from the Internet <URL:http://www.hastings-inst.com/pdfs/2002.pdf.
Teledyne Hastings Instruments, OBE: Dual Sensor Vacuum Gauge [online], Apr. 2005 [retrieved Jun. 3, 2005]. Retrieved from the Internet <URL:http://www.hastings-inst.com/pdfs/OBE—2002pdf.
English, J., et al., “A Wide Range Constant-Resistance Pirani Gauge with Ambient Temperature Compensation,”J. Sci. Instrum., vol. 42, No. 2, pp. 77-80 (1965).
Billmayer, H., “Ausgewählte Meβprinzipien zur Messung von Absolut- und Differenzdrücken von Gasen,”Messen Prufen automatisieren, vol. 27, No. 5, pp. 216-223 (1991).
Arnold Paul C.
Carmichael Larry K.
Rutt Paul M.
Allen Andre J.
Brooks Automation Inc.
Hamilton Brook Smith & Reynolds P.C.
Jenkins Jermaine
LandOfFree
Method and apparatus for storing vacuum gauge calibration... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for storing vacuum gauge calibration..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for storing vacuum gauge calibration... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3941744