Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2005-11-08
2008-11-18
Ramos-Feliciano, Eliseo (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S118000, C702S119000, C702S120000, C702S121000, C324S765010
Reexamination Certificate
active
07454305
ABSTRACT:
A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage device within each respective chip. Then, for each of the remaining chips, a two-dimensional interpolation is performed to determine the process parameter value for the respective chip based on the measured value. The interpolated values are recorded along with the coordinates of the chip in an efuse control file. Such information is subsequently stored into an efuse module within the chip. On-chip digital control structures are used to adjust certain operational characteristics of a functional component within the chip based on the information stored in the efuse module.
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Bonaccio Anthony R.
Haar Allen P.
Iadanza Joseph A.
Stout Douglas W.
Wemple Ivan L.
Dillon & Yudell LLP
Harding W. Riyon
Huynh Phuong
International Business Machines - Corporation
Ramos-Feliciano Eliseo
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