Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Patent
1998-04-30
1999-11-16
Barlow, John
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
702 81, 702182, 3641486, G06F 1700
Patent
active
059873981
ABSTRACT:
A method and apparatus for analyzing a process or machine having a non-constant mean of a response variable using statistical process control techniques. Several measurements of a response variable are taken while the monitored machine is known to be operating in control. Through statistical regression techniques, a mathematical formula is derived to predict the value using indicator variables at various periods in the process. Then, while the process or machine is operating on an ongoing basis, actual measurements of the response variable are taken and compared to the predicted values using indicator variables calculated from the derived formula. Statistical process control rules are applied to the measured values of the response variable and the predicted value using indicator variables to determine if the machine or process has fallen out of control.
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Chou Youn-Min
Halverson Galen Dean
Barlow John
Bui Bryan
Kananen Ronald P.
Sony Corporation
Sony Electronics Inc.
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