Method and apparatus for state analysis

Details Method and apparatus for state analysis Method and apparatus for state analysis

1989-01-27

1990-10-09

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 49, 250307, 250310, G01N 23223

Patent

active

049625160

ABSTRACT:
A method for analyzing a state of an element in a specimen comprises the steps of applying an exciting source to the element, detecting the intensity of characteristic X-rays generated from measurement points at two wavelengths previously selected depending on the state of the element to be analyzed, comparing the intensity ratio of the characteristic X-rays at the two wavelengths to detect some measurement points providing the detected intensity ratio falling within a range selected depending on the state of the element, and outputting state detection signals detected only at said some measurement points to obtain a line analysis or a two-dimensional scanning image.

REFERENCES:
patent: 2897367 (1959-07-01), Andermann et al.
patent: 3103584 (1963-09-01), Shapiro et al.
patent: 4476386 (1984-10-01), Reid et al.
patent: 4559450 (1985-12-01), Robinson et al.
Compton, A. H., X-Rays and Electrons, D. van Nostrand Co., New York, 1926, pp. 54-57.
Baun, W. L., "Characterization of Thin Anodized Films on Aluminum with Soft X-Ray Spectroscopy", Jour. Electrochem. Soc. (USA), vol. 123, No. 1, Jan. 1976.

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