Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1997-04-01
1998-11-10
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
356352, G01C 902
Patent
active
058352147
ABSTRACT:
A method and apparatus for analyzing an optical image of a scene to determine the spectral intensity of each pixel thereof, by: collecting incident light from the scene; scanning the incident light; passing the scanned light through an interferometer which outputs modulated light corresponding to a predetermined set of linear combinations of the spectral intensity of the light emitted from each pixel; focusing the light outputted from the interferometer on a detector array; and processing the output of the detector array to determine the spectral intensity of each pixel thereof.
REFERENCES:
patent: 3702735 (1972-11-01), Potter, Jr.
patent: 4509857 (1985-04-01), Vermande
patent: 4976542 (1990-12-01), Smith
patent: 5377003 (1994-12-01), Lewis et al.
patent: 5528368 (1996-06-01), Lewis et al.
Hammer et al, "Remote Sensing of Earth's Atmosphere and Surface Using a Digital Array Scanned Interferometer", J. Imaging Science & Tech., vol. 35, No. 5 pp. 417-422 (1992).
Coarer et al., "Un Spectrometre Imageur Pour L'astronomie", Comptes Rendus de l'Academie des Sciences, No. Series II, pp. 45-49 (1992). Emissions from the Jupiter Plasma Torus", Astrophysical Journal, 259:900-907 (1982).
Buckwald Robert A.
Cabib Dario
Friedman Zvi
Lipson Stephen G.
Applied Spectral Imaging Ltd.
Friedman Mark M.
Turner Samuel A.
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