Method and apparatus for source synchronous testing

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Having specific delay in producing output waveform

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S724000, C714S731000, C327S158000

Reexamination Certificate

active

07548105

ABSTRACT:
A method and apparatus for source synchronous testing have been disclosed. In one case a data signal is delayed and a selectively activated delay is applied to a clock. This allows the clock to be positioned before the data and also after the data.

REFERENCES:
patent: 5986830 (1999-11-01), Hein
patent: 6356132 (2002-03-01), Mastrocola et al.
patent: 6505149 (2003-01-01), Griswold et al.
patent: 6760873 (2004-07-01), Hao et al.
patent: 6775637 (2004-08-01), Garcia
patent: 7164297 (2007-01-01), Flynn
patent: 7197682 (2007-03-01), Niijima
patent: 7240269 (2007-07-01), Ochi
patent: 2004/0181714 (2004-09-01), Jungerman

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for source synchronous testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for source synchronous testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for source synchronous testing will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4136036

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.