Method and apparatus for slanted attitude testing and/or for co-

Details Method and apparatus for slanted attitude testing and/or for co- Method and apparatus for slanted attitude testing and/or for co-

1998-12-02

2000-10-17

Ham, Seungsook

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

29833, 382146, G06K 900

Patent

active

061335797

ABSTRACT:
An entire contact row of an SMD component is illuminated by a light source direction in the direction of the contact row, and a shadow of the entire contact row is directed by a linear sensor. A shift of the contact row perpendicular to a contact surface formed by the contact row effects a shift of the position of the shadow on the linear sensor and also effects a modification of the expanse of the shadow. By identifying the minimum expanse of the shadow, a criterion for the co-planarity of the contact row derives from the minimum expanse itself and an indicator about the slanting attitude of the component derives from the position having the minimum expanse.

REFERENCES:
patent: 5502890 (1996-04-01), Gunter
patent: 5687475 (1997-11-01), Gunter
patent: 6028319 (2000-02-01), Tsai

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