Method and apparatus for sensing or determining one or more prop

Boots – shoes – and leggings

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Details

356432, 356382, 364524, 2503581, G01N 2316, G01B 1502

Patent

active

048857092

ABSTRACT:
In the method and apparatus, optimum correlation between measured and known values of transmittance or reflectance determines the property or identity of a sample. Three or more discrete radiation components can be selected which are transmitted or reflected by relatively different amounts due to interference, absorption or scatter, thereby enabling fewer radiation components to be used to provide an accurate result. The known values can be derived by analogue or digital techniques, the digital technique employing a model or models taking account of absorption, interference and/or scatter. Techniques are disclosed for reducing computing time by range ajustment, identification of a zero correlation value in a differential function of the model or models and computation of correlation coefficients for two or more groups of radiation components.

REFERENCES:
patent: 3955086 (1976-05-01), Tsujii et al.
patent: 4017192 (1977-04-01), Rosenthal
patent: 4194217 (1980-03-01), van den Bosch
patent: 4355903 (1982-10-01), Sandercock
patent: 4414635 (1983-11-01), Gast
patent: 4510577 (1985-04-01), Tsujii et al.
patent: 4513384 (1985-04-01), Rosencwaig
patent: 4555767 (1985-11-01), Case et al.
patent: 4574387 (1986-03-01), Gignoux et al.
patent: 4672196 (1987-06-01), Canino
patent: 4676647 (1987-06-01), Kikkawa et al.
patent: 4687333 (1987-08-01), Odasima et al.
patent: 4717954 (1988-01-01), Fujita et al.
"A New Method for Obtaining Individual Component Spectra from those of Complex Mixtures", D. E. Honigs, G. M. Hieftje and T. Hirschfeld, pp. 317-322, 1369 Spectroscopy 38 (1984) May/Jun., No. 3, Baltimore, Md., U.S.A.
"Transparent Film Thickness Measurement", W. R. Case and W. E. Johnson, vol. 24, No. 1A, Jun., 1981, IBM Technical Disclosure Bulletin.
Hewig et al: In-Situ, Real Time Thin Film Refractive Index and Thickness Monitor, IBM Technical Disclosure Bulletin, vol. 25. No. 1, Jun., 1982, pp. 436-438.

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