Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-09-26
2006-09-26
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S130000, C438S017000, C438S018000, C257SE21002, C257SE21053
Reexamination Certificate
active
07113881
ABSTRACT:
A method, an apparatus, and a computer program are provided for the semi-automatic extraction of an ideality factor of a diode. Traditionally, current/voltage curves for diodes, which provided a basis for extrapolating the ideality factors, had to be determined by hand. By employing a thermal voltage proportional to absolute temperature (PTAT) generator in conjunction with an extraction mechanism, the ideality factor can be extracted in an semi-automatic manner. Therefore, a reliable, quick, and less expensive device can be employed to improve measurements of ideality factors.
REFERENCES:
patent: 2004/0159904 (2004-08-01), Clabes et al.
Boerstler David W.
Hailu Eskinder
Qi Jieming
Bui Bryan
Carwell Robert M.
Gerhardt Diana R.
Walder, Jr. Stephen J.
Walling Meagan S
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