Method and apparatus for self-testing a transducer system

Details Method and apparatus for self-testing a transducer system Method and apparatus for self-testing a transducer system

1990-12-28

1993-06-15

Lall, Parshotam S.

Boots, shoes, and leggings

364574, 371 151, G01R 3128

Patent

active

052205193

ABSTRACT:
A method and apparatus for self-testing a transducer system. A signal generator is used to generate a predetermined sequence of signals or pulses, and the sequence has a finite test-time duration. The self-test signal also has the properties that its time varying part: (1) sums to zero over the test time interval; and (2) it has a relatively flat frequency spectrum. Additionally, calculations are made even simpler if the self-test signal is chosen to switch at pseudo random intervals between two fixed values. The output of the self-test system has one term which is directly proportional to the transducer system sensitivity and represents the desired self-test result, and one or more error terms which tend toward zero as the test-time duration increases. The self-testing system of the present invention may be implemented either in analog circuitry, digital logic, or a combination thereof. Preferably the transducer system is operatively disposed on an integrated circuit chip, and self-testing system of the present invention is similarly situated on the same integrated circuit chip.

REFERENCES:
patent: 4093988 (1978-06-01), Scott
patent: 4860227 (1989-08-01), Tamamura
Briggs et al.; Correlation Analysis of Process Dynamics Using Pseudo-Random Binary Test Perturbations; Proc. Instn. Mech. Engrs; 1964-1965 vol. 179, Pt 3H; pp. 37-51.

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