Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2006-01-31
2006-01-31
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S521000
Reexamination Certificate
active
06992778
ABSTRACT:
A conventional phase shifting interferometer that is used for measuring distances (e.g., in the micron range) typically provides two orthogonal, or quadrature, signals. The output signals typically include an offset that introduces a related measurement error unless it is compensated or eliminated. A standard way for eliminating offsets is to generate and/or process additional signals that are phase shifted by 180 degrees, or other known amounts. In contrast, the present invention provides a signal indicative of the offset contribution to a detector signal in an interferometer by varying the wavelength of radiation from the illumination source of the interferometer during the time that the offset determining signal is acquired or integrated by that detector. The method can be conveniently implemented with each signal detection channel of an interferometer, for a variety of interferometer designs. The method determines the offset error within a very short time period and without the need to provide additional or adjusted optical paths, or controlled phase shifts.
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Christensen O'Connor Johnson & Kindness PLLC
Connolly Patrick
Mitutoyo Corporation
Toatley , Jr. Gregory J.
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