Method and apparatus for self-assembly of functional blocks...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – Groove

Reexamination Certificate

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C257S559000

Reexamination Certificate

active

07321159

ABSTRACT:
Methods for fabricating an assembly having functional blocks coupling to a substrate. The method includes providing the substrate with receptor sites wherein each of the receptor sites is designed to couple to one of the functional blocks. Electrodes are coupled to the substrate. The electrodes cover the receptor sites such that portions of the receptor sites are coated with the electrodes. Applying a voltage source to the electrodes using a first electrical circuit such that each electrode has a voltage different from another electrode. The electrodes form an electric field. The functional blocks having electronic devices and being in a slurry solution are dispensed over the substrate. Each functional block is fabricated out of materials having a high dielectric constant such that said functional blocks are attracted to the higher field strength regions and are guided to the receptor sites.

REFERENCES:
patent: 3291896 (1966-12-01), Vincent
patent: 3439416 (1969-04-01), Yando
patent: 4184188 (1980-01-01), Briglia
patent: 4194668 (1980-03-01), Akyurek
patent: 4520421 (1985-05-01), Sakitani et al.
patent: 4542397 (1985-09-01), Biegelsen et al.
patent: 4724510 (1988-02-01), Wicker et al.
patent: 4962441 (1990-10-01), Collins
patent: 5034802 (1991-07-01), Liebes, Jr. et al.
patent: 5355577 (1994-10-01), Cohn
patent: 5539179 (1996-07-01), Nozawa et al.
patent: 5545291 (1996-08-01), Smith et al.
patent: 5783856 (1998-07-01), Smith et al.
patent: 5824186 (1998-10-01), Smith et al.
patent: 5858099 (1999-01-01), Sun et al.
patent: 5904545 (1999-05-01), Smith et al.
patent: 6222211 (2001-04-01), Chen
patent: 6274508 (2001-08-01), Jacobsen et al.
patent: 6468638 (2002-10-01), Jacobsen et al.
patent: 6683663 (2004-01-01), Hadley et al.
patent: 6753611 (2004-06-01), Maeno et al.
patent: 6780696 (2004-08-01), Schatz
patent: 6812557 (2004-11-01), Matsuo et al.
patent: 6864122 (2005-03-01), Huse et al.
patent: 6927085 (2005-08-01), Hadley et al.
patent: 6970219 (2005-11-01), Hermann
patent: 2004/0068864 (2004-04-01), Hadley et al.
patent: 2005/0255620 (2005-11-01), Hadley et al.
patent: WO 01/34765 (2001-05-01), None
Kazuhiro Saitou, “Confrontational Switching in Self-Assembling Mechanical Systems,” IEEE Transactions on Robotics and Automation vol. 15, No. 3, Jun. 1999, pp. 510-520.
Kazuhiro, Saitou, et al., “Externally-Resonated Linear Micro Vibromotor for Micro Assembly,” Dept. of Mechanical Engineering and Applied Mechanics, University of Michigan, Ann Harbor, MI, 12 pages.
Cohn, et al., “Self-Assembly of Microsystems Using Non-Contact Electrostatic Traps,” Department of Electrical Engineering and Computer Science, Berkeley, California, 1995, pp. 893-900.
Fuhr, et al., “Levitation, holding, and rotation of cells within traps made by high-frequency fields”, Elsecier Science Publishers, B.V., Dec. 1992, pp. 215-223.
Cohn, M., “Assembly Techniques for Microelectromechanical Systems,” Electrical Engineering and Computer Sciences, Berkeley, California, 75 pgs.

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