Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined
Patent
1986-04-11
1987-06-30
Newsome, John H.
Coating processes
Measuring, testing, or indicating
Thickness or uniformity of thickness determined
29 2535, 427100, H04R 1700, C23C 1600
Patent
active
046769935
ABSTRACT:
A dual-coupled resonator crystal is fine-tuned by frequency balancing the input and output resonators and thereafter plating a coupling adjust spot on the grounded side shadowing the unelectroded region of the front side of the crystal to produce a change in synchronous peak separation frequency. Thereafter, the front side electrodes are sequentially plated to bring plateback and synchronous peak separation frequency to their target values. Interim adjustments in synchronous peak separation frequency may be made during the tuning process to compensate for misalignment of the plating elements.
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Crescenzi Robert J.
Roberts Gerald E.
Toliver Samuel
General Electric Company
Lampe, Jr. Robert C.
Newsome John H.
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