Method and apparatus for selective deposition

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S750000, C257S758000

Reexamination Certificate

active

11011324

ABSTRACT:
A method for selectively depositing a source material on a wafer is disclosed. In one embodiment, a wafer is having at least one recessed feature is provided. A top surface of the wafer is then coated with an inhibiting material. Finally, a source material is selectively deposited in the at least one recessed feature, the source material repelled by the inhibiting material. In another embodiment, the inhibiting material is one of a wax, a surfactant or an oil.

REFERENCES:
patent: 5354593 (1994-10-01), Grandmont et al.
patent: 5736424 (1998-04-01), Prybyla et al.
patent: 6511912 (2003-01-01), Chopra et al.
patent: 6605534 (2003-08-01), Chung et al.
patent: 6713381 (2004-03-01), Barr et al.
patent: 6787460 (2004-09-01), Lee et al.
patent: 6790773 (2004-09-01), Drewery et al.
patent: 2001/0055851 (2001-12-01), Horii
patent: 0 984 485 (2000-03-01), None
Wolf, Stanley “Silicon Processing for the VSLI ERA” vol. 4, Deep Submicron Process Technology Lattice Press, Sunset Beach ca 2002, pp. 679-681.
Wolf, Stanley “Silicon Processing For The VLSI Era” vol. 4, Deep—Submicron Process Technology, Lattice Press Sunset Beach, California Copyright 2002, p. 639.
Office Action from U.S. Appl. No. 10/404,775 mailed Nov. 8, 2006, 12 pgs.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for selective deposition does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for selective deposition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for selective deposition will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3873122

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.