Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-15
2006-08-15
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07091736
ABSTRACT:
A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized voltage, wherein each of the settings is represented by a different quantized voltage; wherein the functional module implements the one of the settings represented by the control signals.
REFERENCES:
patent: 5260949 (1993-11-01), Hashizume et al.
patent: 5631941 (1997-05-01), Shou et al.
patent: 5937180 (1999-08-01), Lindqvist
patent: 6035430 (2000-03-01), Taniguchi
patent: 6434201 (2002-08-01), Ohno
patent: 6727721 (2004-04-01), Altrichter et al.
patent: 6894501 (2005-05-01), Flasck et al.
patent: 2004/0000926 (2004-01-01), Ooshita
patent: 2004/0124875 (2004-07-01), Dabral et al.
patent: 2005/0156615 (2005-07-01), Saitou et al.
patent: WO 9723827 (1997-07-01), None
Japanese Patent Abstract, JP 04-207814.
IBM Technical Disclosure Bulletin, vol. 14, Issue No. 12 pp. 3828-3830, May 1972.
Burstein Andrew J.
Flasck Jeremy M.
Lidsky David B.
McJimsey Michael D.
Deb Anjan
Fish & Richardson P.C.
Volterra Semiconductor Corporation
LandOfFree
Method and apparatus for selecting multiple settings for an... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for selecting multiple settings for an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for selecting multiple settings for an... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3645317