Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Quality evaluation
Reexamination Certificate
2006-09-12
2006-09-12
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Quality evaluation
Reexamination Certificate
active
07107167
ABSTRACT:
Methods and apparatus for performing a test on a product include applying a test on a product and, if the test indicates a defect in the product, determining whether the defect is external to the product. The method further includes, if the defect is determined to be external to the product, skipping repair of the product for the defect. In one aspect, a method for performing a test on a product includes determining an external defect for the product and, if an external defect exists for the product, skipping further testing of the product for the determined external defect.
REFERENCES:
patent: 2004/0186686 (2004-09-01), Hsia
patent: 2005/0175231 (2005-08-01), Hirata et al.
Barlow John
Chow Christopher S.
Khuu Cindy D.
O'Connell Robert J.
Qualcomm Inc.
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