Method and apparatus for searching electromagnetic disturbing so

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

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324 725, 324544, G01R 3102, G01R 3128

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active

061547107

ABSTRACT:
Voltages and currents of electromagnetic interference developed in cables or the like electrically connected to pieces of electronic equipment are respectively measured by non-contact voltage probes and non-contact current probes both of which have double coaxial cylindrical type inner and outer electrodes and wherein the outer electrode is grounded and a voltage output under capacitive coupling is taken out from the inner electrode. An effective component of energy of each propagating electromagnetic interference is calculated from the result of the measurements. An invading route of each electromagnetic interference is specified from the magnitude of the energy and the direction in which the energy flows. While the pieces of electronic equipment are being placed under operating conditions, the behavior of the electromagnetic interference can be accurately recognized and the invading route of each electromagnetic interference can be quantitatively specified according to a physical quantity.

REFERENCES:
patent: 5311116 (1994-05-01), Rogers
patent: 5337261 (1994-08-01), Rogers
G. F. Turnball et al., "Voltmetre Alternatif A Machoires Sans Contact," Le Journal De L'Equipment Electrique, pp. 117 and 119, Nov. 1966.
Kobayashi et al., "Transmission Route Searching Method For Conducted Interference," Chuo University, Sep. 5-8, 1995, p. 173.
Kobayashi et al., "Transmission Route Searching Method For Conducted Interference by Measuring Its Energy," EMCJ95-69-75, IECE Tech. Report, Dec. 15, 1995, pp. 7-13.
Kobayashi et al., "Fundamental Study For Transmission Route Searching Method of Impulse Conducted Noises," Tokyo Institute of Tech., Mar. 28-31, 1996, p. 319.
Kobayashi et al., "Study For No-Contact Measurement Method of Common-Mode Interference Voltage," Kukuoka Institute of Technology, Mar. 27-30, 1995, p. 294.

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