Method and apparatus for screening integrated circuit chips for

Details Method and apparatus for screening integrated circuit chips for Method and apparatus for screening integrated circuit chips for

1995-12-22

1998-11-24

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 731, 3241581, G01R 104, G01R 3126

Patent

active

058412930

ABSTRACT:
Integrated circuit chips are screened for susceptibility to latch-up by first applying power and ground to the chips to be tested while limiting current flow to a non-destructive compliance value. Next, the chips are irradiated with a pulse of radiation having an energy dose calibrated to trigger latch-up in latch-up sensitive chips. Upon termination of the radiation, the current is detected. Chips having current persisting at the compliance value are indicated as failing. The current in passing chips returns approximately to the original standby current value. In the preferred embodiment, the radiation is visible light and the radiation energy dose is selected to cause a percentage of chips to latch-up approximating the percentage of failures expected at burn-in.

REFERENCES:
patent: 4786865 (1988-11-01), Arimura et al.
patent: 5396169 (1995-03-01), Buehler

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