Method and apparatus for scanning regions

Details Method and apparatus for scanning regions Method and apparatus for scanning regions

2007-12-18

2007-12-18

Assaf, Fayez G. (Department: 2872)

Optical: systems and elements

Deflection using a moving element

Using a periodically moving element

C359S204200, C359S213100, C347S233000

Reexamination Certificate

active

11287678

ABSTRACT:
A beam scanner is operable to scan light in two or more axes, typically in a raster pattern that includes a fast scan axis and a slow scan axis. Plural beams of light are scanned, each beam of light producing a scanned region that at least partially overlaps at least one adjoining scanned region. Scanned regions may be aligned to adjoin and overlap along a dimension corresponding to the slow scan axis. The beam scanner may comprise a scanned beam display and/or a scanned beam image capture device. In a display, the power level of overlapping displayed pixels may be scaled to provide smooth transitions between adjoining regions to improve the image quality presented to a viewer. In an image capture device, one or more detectors is operable to collect light scattered from adjoining regions and a controller is operable to produce an image from the scanned regions.

REFERENCES:
patent: 4553176 (1985-11-01), Mendrala
patent: 5694180 (1997-12-01), Deter et al.
patent: 6038051 (2000-03-01), Suzuki et al.
patent: 2003/0063298 (2003-04-01), Komiya et al.

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