Measuring and testing – Sampler – sample handling – etc. – With constituent separation
Patent
1997-06-12
1999-08-24
Noland, Thomas P.
Measuring and testing
Sampler, sample handling, etc.
With constituent separation
7386312, 7386323, 7386433, G01N 124
Patent
active
059426993
ABSTRACT:
A method for collectively sampling a plurality of cargo items for contaminants such as chemical residues. The items are placed in a generally airtight chamber and agitated physically to release particulates and vapors from the surfaces and interior of the items. The methods of physical agitation include vibrating the items, and pressurizing and depressurizing the chamber, with the pressurizing being done by introducing bursts of high pressure air into the chamber and by directing jets of high pressure air at the cargo. Optionally, the high pressure air may be heated or mixed with solvent vapors. This physical agitation drives particulates and vapors of contaminants into suspension in the air in the chamber. Air withdrawn during depressurization is passed through a collection system to collect the particulates and vapors for subsequent analysis.
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Patent Abstracts of Japan Grp C0800, vol. 15, No. 38 Abs Pub Date Jan. 30, 1991 (02-274868) "Producing Device for Semiconductor" Minoru Inoue.
Buechler Sam S.
Ornath Fredy
Friedman Mark M.
Noland Thomas P.
R.A.Y. Buechler Ltd.
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