Data processing: measuring – calibrating – or testing – Measurement system – History logging or time stamping
Reexamination Certificate
2006-04-11
2006-04-11
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
History logging or time stamping
Reexamination Certificate
active
07027954
ABSTRACT:
A method and apparatus that processes time series, event and/or activity data of a process according to a data structure. The data structure defines one or more activities that frame the time series, event and/or activity data. Each activity and each event has one or more attributes. Each attribute has a value. At least one of the attributes defines an interval of the activity by start and end times. Another attribute includes a time varying parameter that represents the time series data. Another attribute defines a time stamp of an event. The time varying parameter is linked to a device that produces the time series data when the process is run. The time series, event and/or activity data is collected and processed according to the data structure for storage in and/or retrieval from a memory. A relationship between data of one or more activities and the time series, event and/or activity data is processed according to the data structure to retrieve the time series, event and/or activity data from the memory.
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International Search Report, dated Apr. 28, 2003, relative to PCT application No. PCT/US 02/41711, the foreign equivalent to the instant U.S. Appl. No. 10/026,297.
Mets Christian M. H.
Montalvo Roel Ila K.
Rybarczyk David F.
Strilich James A.
Barlow John
Bhat Aditya
Honeywell International , Inc.
Ohlandt Greeley Ruggiero & Perle L.L.P.
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