Method and apparatus for representing high speed...

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system

Reexamination Certificate

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Reexamination Certificate

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08046208

ABSTRACT:
A simulation apparatus and method is provided for simulating complex high speed interconnects for which closed forms of the S-parameter are incorporated. Differential transmission lines are represented in a causal manner analytically using the 4-port S-parameter without concerns of passivity and stability. Difficult discontinuities of interconnect such as differential vias are represented in closed form and the present invention allows those interconnects to be characterized by 4-port S-parameter measurements or simulation. A complete method of combining causal transmission line models with discontinuities in cascade is provided.

REFERENCES:
patent: 2003/0173978 (2003-09-01), Adamian et al.
patent: 2008/0191818 (2008-08-01), Lee et al.
Cai, Kevin, Sun Microsystems, “Closed Form Representations of High Speed Interconnects, Part A: 2-Port Cascaded S-Parameter and Group Delay (v0.7)” May 16, 2006, 21 pages.
Cai, Kevin, Sun Microsystems, “Closed Form Representations of High Speed Interconnects, Part B: 4-Port Cascaded S-Parameter (v0.3)” May 15, 2006, 26 pages.
Arabi, Tawfik Rahal et al. “On the Modeling of Conductor and Substrate Losses in Multiconductor, Multidielectric Transmission Line Systems,” IEEE Transactions on Microwave Theory and Techniques, Jul. 1991, 39(7):1090-1097.
Zhong, Bing et al., “A Study of Hybrid Phase-Pole Macromodel for Transient Simulation of Complex Interconnects Structures,” IEEE Transactions on Computer-Aided Design, Aug. 2005, 24(8):1250-1261.
Bockelman David E. et al., “Combined Differential and Common-Mode Scattering Parameters: Theory and Simulation,” IEEE Transactions on Microwave Theory and Techniques, Jul. 1995, 43(7):1530-1539.
Bockelman, David E. et al., “Pure-Mode Network Analyzer for On-Wafer Measurements of Mixed-Mode S-Parameters of Differential Circuits,” IEEE Transactions on Microwave Theory and Techniques, Jul. 1997, 45 (7):1071-1077.
Djordjevic, Antonije R. et al., “Wideband Frequency-Domain Characterization of FR-4 and Time Domain Causality,” IEEE Transactions on Electromagnetic Compatibility, Nov. 2001, 43(4):662-667.
Miller, Edmund K., “Model-Based Parameter Estimation in Electromagnetics: Part I. Background and Theoretical Development,” IEEE Antennas and Propagation Magazine, 1998, 40(1):42-52.
Engin, A. Ege et al., “Time-Domain Modeling of Lossy Substrates with Constant Loss Tangent,” Proceedings of 8th IEEE Workshop on Signal Propagation on Interconnects, 2004, 151-154.
Nakhla, Natalie M. et al., “DEPACT: Delay Extraction-Based Passive Compact Transmission-Line Macromodeling Algorithm,” IEEE Transactions Advanced Packaging, Feb. 2005, 28(1):13-23.
Xu, Qin-Wei et al., “Transient Analysis of Lossy Interconnects by Modified Method of Characteristics,” IEEE Transactions on Circuit Systems—1: Fundamental Theory and Applications, Mar. 2000, 47(3):363-375.
Speciale, Ross A. “Even- and Odd-Mode Waves for Nonsymmetrical Coupled Lines in Nonhomogeneous Media,” IEEE Transactions on Microwave Theory and Techniques, Nov. 1975, MTT-23(11):897-908.
Syverson, Seth L. et al., “Evaluation of Frequency-Dependent Transmission Line Model Extraction Methods Based on Laboratory Measurements,” Proceedings of IEEE 2004 Electronic Components and Technology Conference, Jun. 2004, 2:i-ii,1416-1419.
Su, W. et al., “Crosstalk Analysis of Multisection Multiconductor Lines,” IEEE Transactions Instrumentation Measurement, Dec. 1992, 41(6):926-931.
Cai, Xiao-Ding et al, “Time Domain Analysis of a Through Hole Via With Time Dependent Skin Effect Model,” Proceedings of 1995 SBMO/IEEE MTT-S International Microwave and Optoelectronics Conference,1995, 2:862-867.

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