Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-09-11
2007-09-11
Chawan, Sheela (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S203000, C382S305000, C707S793000, C707S793000, C345S427000
Reexamination Certificate
active
10220636
ABSTRACT:
A method of representing an object appearing in an image, the method comprising deriving a plurality of view descriptors of the object, each view descriptor corresponding to a different view of the object, and associating the two or more view descriptors, the method comprising indicating for each view descriptor when the respective view corresponds to a view of the object appearing in the image.
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Bober Miroslaw
Cooper James
Birch & Stewart Kolasch & Birch, LLP
Chawan Sheela
Mitsubishi Denki & Kabushiki Kaisha
Mitsubishi Electric Information Technology Centre Europe BV
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