Method and apparatus for removing quantization effects in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Details

C324S076380, C702S075000, C702S076000, C702S077000, C702S189000, C708S300000, C708S321000, C708S403000

Reexamination Certificate

active

11342057

ABSTRACT:
One embodiment of the present invention provides a system that reconstructs a high-resolution signal from a set of low-resolution quantized samples. During operation, the system receives a time series containing low-resolution quantized signal values which are sampled from the high-resolution signal. Next, the system performs a spectral analysis on the time series to obtain a frequency series for the low-resolution quantized signal values. The system next selects a subset of frequency terms from the frequency series which have the largest amplitudes. The system then reconstructs the high-resolution signal by performing an inverse spectral analysis on the subset of the frequency terms.

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patent: 4937763 (1990-06-01), Mott
patent: 5014229 (1991-05-01), Mofachern
patent: 5250907 (1993-10-01), Fukui
patent: 5359663 (1994-10-01), Katz
patent: 5574674 (1996-11-01), Pan
patent: 5917738 (1999-06-01), Pan
patent: 02-124622 (1990-05-01), None
patent: WO 95/25382 (1995-09-01), None

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