Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2005-01-25
2005-01-25
Stafira, Michael P. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Reexamination Certificate
active
06847449
ABSTRACT:
A method and apparatus for reducing speckle due to MSL, without any loss of resolution, by averaging over different angles of the incident light at low input resolution, while collecting the backscattered light at a full resolution of a lens is described. The present invention allows discrimination against the speckle due to coherent MSL.
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Bashkansky Mark
Reintjes John F
Karasek John J.
Legg L. George
Stafira Michael P.
The United States of America as represented by the Secretary of
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