Method and apparatus for reducing electrostatic discharge during

Electricity: electrical systems and devices – Discharging or preventing accumulation of electric charge – Specific conduction means or dissipator

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738656, 374 57, H05F 302

Patent

active

061010839

ABSTRACT:
A method and apparatus for essentially eliminating ESD damage to integrated circuits being subjected to thermal shock testing includes the utilization of a static dissipative plastic carrier capable of withstanding high temperatures (e.g., 155.degree. C.) and exhibiting a surface resistivity in the range of, for example, 10.sup.10 -10.sup.12 .omega./.quadrature.. Such a static dissipative plastic support structure will therefore eliminate static buildup during integrated circuit testing and prevent ESD damage to the circuits.

REFERENCES:
patent: 4316231 (1982-02-01), Michel
patent: 4519718 (1985-05-01), Staffin et al.
patent: 4779163 (1988-10-01), Bickford et al.
patent: 5290101 (1994-03-01), Englert et al.
patent: 5646813 (1997-07-01), Jon et al.

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