Radiant energy – Photocells; circuits and apparatus – Photocell controlled circuit
Reexamination Certificate
2007-11-20
2010-12-28
Ko, Tony (Department: 2878)
Radiant energy
Photocells; circuits and apparatus
Photocell controlled circuit
C348S308000, C438S073000
Reexamination Certificate
active
07858914
ABSTRACT:
Methods and apparatuses for reducing dark current and hot pixels in CMOS image sensors. A pixel apparatus includes a photosensor capable of generating dark current, a floating diffusion region coupled to the photosensor by way of a charge transfer transistor, a rest transistor connected between the floating diffusion region and an array pixel supply voltage. The array supply voltage varies between first and second voltages when sampling pixel signals from the pixel.
REFERENCES:
patent: 5831675 (1998-11-01), Ueno
patent: 6232626 (2001-05-01), Rhodes
patent: 6611037 (2003-08-01), Rhodes
patent: 6809359 (2004-10-01), Yamada
patent: 7064406 (2006-06-01), Mouli
patent: 7115855 (2006-10-01), Hong
patent: 7119322 (2006-10-01), Hong
patent: 7187020 (2007-03-01), Mabuchi
patent: 7279395 (2007-10-01), Mouli
patent: 2002/0009824 (2002-01-01), Maeda
patent: 2005/0248673 (2005-11-01), Fowler
patent: 2006/0033129 (2006-02-01), Mouli
patent: 2006/0082667 (2006-04-01), Rhodes
patent: 2006/0146158 (2006-07-01), Toros et al.
patent: 2006/0169870 (2006-08-01), Silsby et al.
patent: 2006/0180741 (2006-08-01), Agranov et al.
patent: 2006/0231733 (2006-10-01), Boemler
patent: 2006/0279649 (2006-12-01), Cole
patent: 2007/0012966 (2007-01-01), Park
patent: 2007/0020791 (2007-01-01), Hsu et al.
patent: 2007/0031987 (2007-02-01), Mouli et al.
patent: 2007/0045679 (2007-03-01), McKee et al.
patent: 2007/0064137 (2007-03-01), Kanbe
patent: 2007/0097241 (2007-05-01), Mabuchi
patent: 2007/0158771 (2007-07-01), Hynecek
patent: 2006093815 (2006-04-01), None
patent: 2007081358 (2007-03-01), None
patent: 20050018512 (2005-02-01), None
patent: WO 03/054922 (2003-07-01), None
patent: WO 2004/044989 (2004-05-01), None
patent: WO 2007/066996 (2007-06-01), None
P.K. Hanumolu, “Design of Low Noise, Low Power Linear CMOS Image Sensors”, Worcester Polytechnic Institute, Apr. 30, 2001, pp. 1-81.
E. R. Fossum, “Digital Camera System On A Chip”, IEEE, May-Jun. 1998, vol. 18, No. 3, pp. 8-15.
I. Takayanagi et al., “Dark Current Reduction in Stacked-Type CMOS-APS for Charged Particle Imaging”, IEEE, Jan. 2003, vol. 50, No. 1, pp. 70-76.
N. Kawai et al., “Measurement of Low-Noise Column Readout Circuits for CMOS Image Sensors”, IEEE, Jul. 2006, vol. 53, No. 7, pp. 1737-1739.
Wang, Ching-Chun, and Sodini, Charles G. , The Effect of Hot Carriers of the Operation of CMOS Active Pixel Sensors, International Electron Devices Meeting, 2001, IEDM. Technical Digest, Washington, DC , Dec. 2-5, 2001: New York, NY, IEEE, US Dec. 2, 2001, pp. 24.5-1-24.5-4, XPO10575190.
Pherai, Shantisaroop, Authorized Officer WIPO, International Search Report, PCT/US2008/083338, Feb. 12, 2009.
Fan Xiaofeng
Ladd John
Li Xiangli
Mauritzson Richard
Aptina Imaging Corporation
Ko Tony
RatnerPrestia
LandOfFree
Method and apparatus for reducing dark current and hot... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for reducing dark current and hot..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for reducing dark current and hot... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4155612