Method and apparatus for reducing afterglow noise in an X-ray in

X-ray or gamma ray systems or devices – Specific application – Absorption

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378 982, 378 988, G01N 2304

Patent

active

056663935

ABSTRACT:
An improved X-ray inspection system comprises a pulsed X-ray source configured to emit short, X-ray pulses for reducing afterglow noise. A rotating cylindrical collimator limits the X rays to a pencil-beam, which is directed across and through an object prior to interception by a detector. The detector comprises a plurality of scintillating screens optically coupled to photoemissive detecting elements. When the short X-ray pulses generated by the source are intercepted by the detector, the outputs of the detecting elements are sampled for only a short period of time, which sampling period is immediately followed by a substantially longer quiescent period of time during which the elements are not sampled. Therefore, only a slight portion of the typical afterglow noise occurs during measurement of a useful X-ray signal.

REFERENCES:
patent: 4430568 (1984-02-01), Yoshida et al.
patent: 4745631 (1988-05-01), Paolini
patent: 4879734 (1989-11-01), Schreckendgust
patent: 5091924 (1992-02-01), Bermbach et al.

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