Method and apparatus for rapidly testing passive components by r

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324534, 324537, 324548, 324549, 333117, G01N 2200

Patent

active

047913517

ABSTRACT:
An apparatus for testing passive two terminal devices in the VHF range comprises an electrical signal generator whose frequency is variable over the VHF range, a distributed constant line having a first end connected to the generator and a second end connected to the device to be tested. A resistive .pi. network is connected to the first end of the line to measure directly the values of the incident wave and of the reflected wave or the maxima and the minima of the total wave at the first end of the line are detected, so as to determine the coefficient of reflection of the line connected to the device to be tested.

REFERENCES:
patent: 3479587 (1969-11-01), MacKenzie et al.
patent: 4041395 (1977-08-01), Hill
patent: 4112382 (1978-09-01), Morrow et al.
patent: 4288875 (1981-09-01), Carter
patent: 4506209 (1985-03-01), Landt
patent: 4683417 (1987-07-01), DeBurgat et al.
Fantom, The Location of Reflections in Two-Port Microwave Components, Nov. 1979.
Staeger et al, "Measurement Accuracy Hinge on Coupler Design", Microwaves, vol. 16, No. 4, Apr. 1977, pp. 41-46.
De Ronde, "A Precise and Sensitive X-Band Reflecto Meter Providing Automatic Full-Band Display of Reflected Coefficient", IEEE Transactions, vol. 13, Jul. 1965, pp. 435-440.
Hewlett-Packard Journal, vol. 31, No. 1, Jan. 1980, pp. 22-32, Palo Alto, California "Vector Impedance Analysis to 1000 MHz" T. Ichino et al., FR-A-2 514,902 (Les Cables de Lyon) pp. 2, 4, 5, Figs. 1, 3.
Electronics, vol. 32, No. 43, Oct. 23, 1959, pp. 120-121, New York, U.S. J. Hanson "Unconventional Technique for Measuring VSWR".
Microwave Journal, vol. 10, No. 1, Jan. 1967, pp. 79-83, US "Complex Impedance and Gain Measurement at RF and Microwave Frequencies".
Telecommunications & Radio Engineering, vol. 35/36, No. 4, Apr. 1971, pp. 103 -105, Silver Spring, MD, L. I. Babak.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for rapidly testing passive components by r does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for rapidly testing passive components by r, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for rapidly testing passive components by r will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2198141

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.