Method and apparatus for rapidly testing capacitors and dielectr

Electricity: measuring and testing – Conductor identification or location – Inaccessible

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324 60CD, 324 57PS, G01R 2726, G01R 1152

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active

046834176

ABSTRACT:
The apparatus comprises a measuring unit (300) which receives a component to be tested (Cx) in series with a reference impedance in a measuring chain, a clock (100) suitable for applying repetitive stimulating pulses to the measuring chain, means for resetting the voltage at the terminals of the reference impedance to zero during each inactive half-cycle of the stimulating pulses, sampling means (400) which sample the response at instants which are progressively shifted relative to the stimulating pulses, and a processing unit (200) which analyzes the samples taken by the sampling unit to deduce the parameters of the tested item using a Foster model.

REFERENCES:
patent: 3824459 (1974-07-01), Uchida
patent: 4216424 (1980-08-01), Vette
patent: 4282480 (1981-08-01), Fujito
patent: 4404481 (1983-09-01), Ide
patent: 4558274 (1985-12-01), Carusillo
Popkirov: "A method for the Measurement of Capacitance . . . ", J. Phys. E: Sci. Instrum-vol. 14, 1981-No. 9-Sep. 1981.
Hagiwara: "Digital Capacitance Meter . . . "-Memoirs Defence Academy of Japan-Jan. 1978-pp. 71-78.
McCreary: "Precision Capacitor Ratio Measurement . . . ", IEEE Trans. Instr. & Meas.-Mar. 79-pp. 11-17.

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