Electricity: measuring and testing – Of geophysical surface or subsurface in situ – Using electrode arrays – circuits – structure – or supports
Reexamination Certificate
2005-09-13
2005-09-13
Nolan, Jr., Charles H. (Department: 2854)
Electricity: measuring and testing
Of geophysical surface or subsurface in situ
Using electrode arrays, circuits, structure, or supports
C600S547000
Reexamination Certificate
active
06943553
ABSTRACT:
A method and apparatus for the rapid tomographic measurement of conductivity distribution in a sample in which current excitations or voltage excitation is applied to the sample via electrodes or the like and potential differences or magnetic field strengths association with those excitation fields are measured and analyzed, e.g. by a Fourier analysis.
REFERENCES:
patent: 5258709 (1993-11-01), Laukien
patent: 5659281 (1997-08-01), Pissanetzky et al.
patent: 5743266 (1998-04-01), Levene et al.
patent: 5810742 (1998-09-01), Pearlman
patent: 5914603 (1999-06-01), Daily
patent: 6026173 (2000-02-01), Svenson et al.
patent: 6167300 (2000-12-01), Cherepenin
patent: 6682492 (2004-01-01), Joensuu
patent: 2001/0051774 (2001-12-01), Littrup et al.
patent: 2004/0077944 (2004-04-01), Steinberg et al.
patent: 691 15 275 (1990-06-01), None
patent: 43 32 257 (1995-03-01), None
patent: 44 12 994 (1995-08-01), None
patent: 198 37 828 (2000-04-01), None
patent: 02 053 029 (2002-07-01), None
“Electrical Impedance Tomography”, M.Cheney, Siam Review vol. 41,No. 1,pp. 85-101, 17 pgs.
“Medical Impendance Tomography Ad Pprocess Impedance Toography . . . ”, Brian H.Brown, Meas.Sci.Technoly 12(2001) 991-996, 6 pgs.
“Electrical Resistance Tomography to Detect Leaks from Buried Pipes”, Josep Jordana et al, Meas.Sci.Technol.12 (2001) 1061-1068, 8 pgs.
Glaas Walter
Kemna Andreas
Tillmann Axel
Verweerd Arre
Zimmermann Egon
Dubno Herbert
Forschungszentrum Julich GmbH
Nolan, Jr. Charles H.
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