Method and apparatus for rapid optical phasing

Details Method and apparatus for rapid optical phasing Method and apparatus for rapid optical phasing

1986-04-30

1989-06-06

Buczinski, Stephen C.

Optics: measuring and testing

By polarized light examination

With birefringent element

356345, G01B 1100, G01B 902

Patent

active

H00006378

ABSTRACT:
A method and apparatus 10 for rapid optical phasing of optical devices utilizing white light interference fringe finding. The apparatus comprises a white light source 12, a beam splitter 18, a scanning mirror 20 and a stationary reflective surface 24. The scanning mirror 20 is moved in piston while reflected light is observed in an electro-optic sensor 32 at a receiver 28. A nulled pattern has been previously established at the receiver 28. An electrical signal from the electro-optic sensor is mounted at amplification and recording means 34 to identify variations in reflected light intensity that are caused by white light fringes. White light fringes only occur at zero optical difference, i.e. when the scanning mirror and stationary reflected surface are in phase.

REFERENCES:
patent: 3363104 (1968-01-01), Waite et al.
patent: 3523735 (1970-08-01), Taylor
patent: 3527537 (1970-09-01), Hobrough
patent: 3936193 (1976-02-01), Auth
patent: 4097150 (1978-06-01), Wu
patent: 4355900 (1982-10-01), Nussmeier
patent: 4583855 (1986-04-01), Bareket
patent: 4600308 (1986-07-01), Waite

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