Image analysis – Applications – Seismic or geological sample measuring
Reexamination Certificate
2005-04-19
2005-04-19
Boudreau, Leo (Department: 2621)
Image analysis
Applications
Seismic or geological sample measuring
C356S030000, C356S335000, C356S336000, C378S070000, C378S071000, C378S073000, C378S081000
Reexamination Certificate
active
06882739
ABSTRACT:
An apparatus and method for performing rapid grain size analysis on a textured polycrystalline material, by generating average grain size and grain size distribution data from x-ray diffraction data of such material. Raw diffraction data is obtained by capturing a plurality of diffraction arcs within a single data capture frame. The raw diffraction data is digitally registered; (3) and the registered diffraction data is filtered to remove background noise, exclude diffraction overlaps or truncations, and compensate for biased data obtained from regions of highly preferred orientations. Average grain size and grain size distribution data are then correlated with the filtered diffraction data. The apparatus for acquiring raw diffraction data includes a collimated x-ray source having means for adjusting beam size and divergence of the x-ray generated, a 2-dimensional area detector for registering diffracted x-ray, and a sample motion assembly for moving the sample in the sample plane. The resulting system is fast, accurate, amenable to automation, and does not require highly skilled personnel to operate.
REFERENCES:
patent: 5724401 (1998-03-01), Kurtz et al.
patent: 5828724 (1998-10-01), Kurtz
patent: 6005914 (1999-12-01), Quinn et al.
patent: 6038026 (2000-03-01), Maris
patent: 6058160 (2000-05-01), Kurtz
patent: 6064717 (2000-05-01), Ortega et al.
patent: 6301330 (2001-10-01), Kurtz et al.
Bruker AXS Products—HI-STAR, “Hi-Star Area Detector” (http://www.esc.cam.ac.uk
ew/v10/research/facilities/xray/histar.html), 1997.*
Krill et al., “Estimating grain size distributions in nanocrystalline materials from X-ray diffraction profile analysis”, A Philosophical Magazine, 1998, vol. 77, No. 3, pp. 621-640.*
Abstract; Schwarzbau, H.; Equipment Measuring Surface Texture—Uses Monochromatic Radiation to Study Surface Layer of Non-Amorphous Polycrystalline Body; (1980).
Hans Joachim Bunge and Helmut Klein, Determination of Quantitative, High-resolution Pole Figures with the Area Detector, Z. Metallkd., 87 (1996) pp. 465-475.
Horst Ebel,Crystallite Size Distributions from Intensities of Diffraction Spots, Powder Defraction, vol. 3, No. 3, pp. 168-171 (Sep. 1998).
Kozaczek Kryzsztof J.
Kurtz David S.
Moran Paul R.
Boudreau Leo
Edwards Patrick L
Fuierer Marianne
Hultquist Steven J.
HyperNex, Inc.
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