Method and apparatus for random electronic component testing

Details Method and apparatus for random electronic component testing Method and apparatus for random electronic component testing

1989-09-22

1991-08-27

Huppert, Michael S.

Classifying, separating, and assorting solids

Sorting special items, and certain methods and apparatus for...

Traveling items shifted to form line, or into end or edge...

209548, 209573, 324158F, B07C 502, B07C 5344, G01R 3126

Patent

active

050426680

ABSTRACT:
A method and apparatus are disclosed for randomly selecting and automatically testing surface mount passive electronic components. A detachable hopper is utilized to contain a plurality of randomly oriented electronic components which are agitated pneumatically and urged by vibration and gravity into a uniform orientation within a groove in an inclined track plate. A seal plate acts in conjunction with the groove within the track plate to form an elongate throat passage which is periodically cleared to prevent clogging by pulsating pneumatic pressure. A component detection circuit is utilized to detect the presence of an electronic component at a predetermined testing position and a pair of movable conductive probes are then urged into contact with the component to permit testing. In response to a successful test the component under test is then ejected pneumatically back into the detachable hopper. In the discussed embodiment of the present invention, an unsuccessful test will require the unsatisfactory component to be manually removed from the testing position by the operator of the apparatus.

REFERENCES:
patent: 3384236 (1968-05-01), Best et al.
patent: 3716134 (1973-02-01), Campbell

Affiliated with

Also associated with

Rating

Method and apparatus for random electronic component testing does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for random electronic component testing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for random electronic component testing will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1409297