Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2006-07-18
2006-07-18
Ahmed, Samir (Department: 2623)
Image analysis
Applications
Manufacturing or product inspection
C359S615000
Reexamination Certificate
active
07079676
ABSTRACT:
A method capable of quantitatively evaluating the intensity of scintillation caused by surface unevenness. Light from a white light source is made incident on a surface of an object to be measured through a matrix filter. Reflected light or transmitted light from the object is photographed with a CCD camera and taken into a computer as data. Image processing for the luminance distribution of the captured light is performed to obtain a standard deviation of dispersion of the luminance distribution. The value of the standard deviation obtained is defined as a scintillation value of the surface of the object. The performance of the object is evaluated by judging whether or not the scintillation value is greater than a predetermined value
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“Measurement Technique for Microabrasion Anti-Glare,”IBM Technical Disclosure Bulletin, Dec., 1982, US, No. 25, Issue 7B, pp. 3612-3613.
Ahmed Samir
Dai Nippon Printing Co. Ltd.
Sughrue & Mion, PLLC
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