Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2005-11-08
2005-11-08
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S300000
Reexamination Certificate
active
06963399
ABSTRACT:
An apparatus for and method of calculating an integrated index of a transparent, translucent or opaque material for a desired wavelength range, the method comprising measuring a filtered value of the material as a function of wavelength within the desired wavelength range and calculating a protection index from the measured filtered value. The integrated index is used to quantify the ultraviolet, infra-red, erythemal or aphakic exposure properties of the material. In addition, the integrated index is used to quantify the photopic and/or scotopic response capabilities of the material. Further, the integrated index is used to quantify the differential or mean color indices of the material in comparison to the color spectrum or another material. Moreover, the integrated index is used to quantify the heat flux absorbed by the material.
REFERENCES:
patent: 3598995 (1971-08-01), Inoue
patent: 3825762 (1974-07-01), White
patent: 3851970 (1974-12-01), Adler et al.
patent: 4015130 (1977-03-01), Landry et al.
patent: 4176957 (1979-12-01), Maeda et al.
patent: 4487502 (1984-12-01), Fantozzi et al.
patent: 4546256 (1985-10-01), Denisov et al.
patent: 4755056 (1988-07-01), Yasuda et al.
patent: 4952027 (1990-08-01), Saito et al.
patent: 5017785 (1991-05-01), Rasanen
patent: 5022754 (1991-06-01), Varnham
patent: 5040889 (1991-08-01), Keane
patent: 5126569 (1992-06-01), Carlson
patent: 5339151 (1994-08-01), Shinn
patent: 5363188 (1994-11-01), Didelot et al.
patent: 5489978 (1996-02-01), Okumura et al.
patent: 5555085 (1996-09-01), Bogdanowicz et al.
patent: 5657116 (1997-08-01), Kohayakawa
patent: 5734578 (1998-03-01), Oh
patent: 5949535 (1999-09-01), Hall
patent: 5971537 (1999-10-01), Fukuma et al.
patent: 6078389 (2000-06-01), Zetter
patent: 6094275 (2000-07-01), Lin
patent: 6178341 (2001-01-01), Macfarlane et al.
patent: 6198531 (2001-03-01), Myrick et al.
patent: 6304326 (2001-10-01), Aspnes et al.
patent: 6333500 (2001-12-01), Gehring et al.
patent: 6335792 (2002-01-01), Tsuchiya
patent: 6359684 (2002-03-01), Ikezawa et al.
patent: 6577387 (2003-06-01), Ross et al.
patent: 2001/0055112 (2001-12-01), Matsubara
The American Conference of Government Industrial Hygienists (ACGIH) 2001 Handbook of TLVs and BEIs (Threshold Limit Values and Biological Exposure Indices, pp. 151-158.
Australian Standard AS 1067.1-1990, “Sunglasses and Fashion.Spectacles, Part 1: Safety Requirements”, Standards Association of Australia.
Australian/ New Zealand AS / NZS 1338.1:1992, “Filters for Eye Protectors, Part 1 : Filters for protection against radiation generated in welding and allied operations”, Standards Association of Australia.
Australian / New Zealand AS / NZS 1338.1:1992 “Filters for Eye Protectors, Part 2: Filters for protection against ultraviolet radiation”, Standards Association of Australia.
Australian / New Zealand AS / NZS 1338.1:1992 “Filters for Eye Protectors, Part 3:Filters for protection against infra-red radiation”, Standards Association of Australia.
“The Effects of Solar UV Radiation on the Eye”, the United Nations Environment Programme, World Health Organization, 1994.
Pamphlet entitled “Sunglasses are More than Shades”, the American Optometric Association.
Cargill Robert L.
Zanelli Claudio I.
Geisel Kara
Haverstock & Owens LLP
Toatley , Jr. Gregory J.
LandOfFree
Method and apparatus for quantifying an “integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for quantifying an “integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for quantifying an “integrated... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3518989