Method and apparatus for quality control of semiconductor device

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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324158F, G01R 3122

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active

040126951

ABSTRACT:
The present method provides for the use as criterion the coefficient m of a deviation of the actual current-voltage characteristic of the p-n junction of a semiconductor device or integrated circuit under test obtained by applying a varying current in the forward direction through a p-n junction. The form of a current variation is chosen such that if the p-n junction has an ideal current-voltage characteristic ##EQU1## the current variation causes constant voltage increments through the p-n junction over the entire range of current values I. It means that for a p-n junction with an actual current-voltage characteristic ##EQU2## the increments obtained will be constant and proportional to the coefficient m. The apparatus for effecting the present method comprises at least two current generators controlled by a current controller, ensuring interrelated currents at their outputs. The current controller ensures that relative variations of each of the currents are equal. A switching element connects the outputs of the generators alternately to the p-n junction. The variable component of the voltage obtained at the junction is converted by a voltage converter to an electrical signal which is applied to a recorder. The present method and apparatus are used for detecting unreliable semiconductor devices and integrated circuits.

REFERENCES:
patent: 3622883 (1971-11-01), Haire
Lutz, O. P., "A Semiautomatic Test . . . ," Solid State Technology; Apr. 1969; pp. 39-43.

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